Ionic/electronic mixed conductor tip of a scanning tunneling microscope as a metal atom source for nanostructuring

DOI PDF 被引用文献8件
  • K. Terabe
    Surface and Interface Laboratory, The Institute of Physical and Chemical Research (RIKEN), 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
  • T. Nakayama
    Surface and Interface Laboratory, The Institute of Physical and Chemical Research (RIKEN), 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
  • T. Hasegawa
    Surface and Interface Laboratory, The Institute of Physical and Chemical Research (RIKEN), 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
  • M. Aono
    Surface and Interface Laboratory, The Institute of Physical and Chemical Research (RIKEN), 2-1 Hirosawa, Wako, Saitama 351-0198, Japan

書誌事項

公開日
2002-05-27
DOI
  • 10.1063/1.1480887
公開者
AIP Publishing

この論文をさがす

説明

<jats:p>Silver sulfide (Ag2S) which has Ag-ionic/electronic mixed conductivity is used for fabricating a tip used for a scanning tunneling microscope. The mixed conductor tip is capable of nanostructuring by depositing Ag atoms continuously on a sample as well as imaging the surface structure. To obtain the surface image, a nanoscale Ag protrusion is formed at an apex of the tip using a local solid electrochemical reaction, working as “a mini-tip.” We fabricate a nanoscale line structure on the sample by scanning the Ag2S tip with the protrusion under appropriate bias voltages and tunneling currents. The structuring is thought to be made up of two layers of Ag atoms deposited from the protrusion.</jats:p>

収録刊行物

被引用文献 (8)*注記

もっと見る

詳細情報 詳細情報について

問題の指摘

ページトップへ