-
- S. Deora
- SEMATECH, Albany, NY, USA
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- G. Bersuker
- SEMATECH, Albany, NY, USA
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- W.-Y. Loh
- SEMATECH, Albany, USA
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- D. Veksler
- SEMATECH, Albany, NY, USA
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- K. Matthews
- SEMATECH, Albany, NY, USA
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- T. W. Kim
- SEMATECH, Albany, USA
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- R. T. P. Lee
- SEMATECH, Albany, USA
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- R. J. W. Hill
- SEMATECH, Albany, NY, USA
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- D.-H. Kim
- SEMATECH, Albany, USA
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- W.-E. Wang
- SEMATECH, Albany, NY, USA
-
- C. Hobbs
- SEMATECH, Albany, NY, USA
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- P. D. Kirsch
- SEMATECH, Albany, NY, USA
書誌事項
- 公開日
- 2013-12
- 権利情報
-
- https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
- DOI
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- 10.1109/tdmr.2013.2284376
- 公開者
- Institute of Electrical and Electronics Engineers (IEEE)
この論文をさがす
収録刊行物
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- IEEE Transactions on Device and Materials Reliability
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IEEE Transactions on Device and Materials Reliability 13 (4), 507-514, 2013-12
Institute of Electrical and Electronics Engineers (IEEE)
