Microoptic double beam system for reflectance and absorption measurements at high pressure
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- K. Syassen
- Physikalisches Institut III, Universität Düsseldorf, D–4000 Düsseldorf 1, Federal Republic of Germany
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- R. Sonnenschein
- Physikalisches Institut III, Universität Düsseldorf, D–4000 Düsseldorf 1, Federal Republic of Germany
書誌事項
- 公開日
- 1982-05-01
- DOI
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- 10.1063/1.1137035
- 公開者
- AIP Publishing
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説明
<jats:p>A microoptical double beam system for reflectance and absorption measurements from small samples (less than 100 μm size) in the spectral range of 0.5–5 eV is described. In conjunction with a diamond anvil high-pressure cell the system is particularly useful for optical reflectivity measurements at pressures up to 400 kbar. Examples are furnished illustrating the use of the system in high-pressure investigations of the stage two graphite intercalation compound C24SbCl5 and of solid oxygen. We briefly comment on Raman spectroscopy at high pressure.</jats:p>
収録刊行物
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- Review of Scientific Instruments
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Review of Scientific Instruments 53 (5), 644-650, 1982-05-01
AIP Publishing
