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Measurement Broadening in Magnetic Resonance
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- Orlo E. Myers
- Convair Scientific Research Laboratory, San Diego, California
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- Eugene J. Putzer
- Convair Scientific Research Laboratory, San Diego, California
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Description
<jats:p>Phase-detection techniques used in recording magnetic resonances are the source of a measurement broadening. Results of a general mathematical treatment for arbitrary line shape and of machine computation for a Lorentz line shape lead to a series of curves which may be used to correct observed widths under circumstances where the Lorentz shape may be verified and effects of finite modulation frequency may be ignored.</jats:p>
Journal
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- Journal of Applied Physics
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Journal of Applied Physics 30 (12), 1987-1991, 1959-12-01
AIP Publishing
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Details 詳細情報について
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- CRID
- 1363670318790179584
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- ISSN
- 10897550
- 00218979
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- Data Source
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- Crossref