Electron Holography: Applications to Materials Questions
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- Hannes Lichte
- Triebenberg Laboratory, Institute of Structure Physics, Technische Universitaet, D 01062 Dresden, Germany;
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- Petr Formanek
- Triebenberg Laboratory, Institute of Structure Physics, Technische Universitaet, D 01062 Dresden, Germany;
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- Andreas Lenk
- Triebenberg Laboratory, Institute of Structure Physics, Technische Universitaet, D 01062 Dresden, Germany;
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- Martin Linck
- Triebenberg Laboratory, Institute of Structure Physics, Technische Universitaet, D 01062 Dresden, Germany;
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- Christopher Matzeck
- Triebenberg Laboratory, Institute of Structure Physics, Technische Universitaet, D 01062 Dresden, Germany;
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- Michael Lehmann
- Institute for Optics and Atom Physics, Technische Universitaet, D 10623 Berlin, Germany
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- Paul Simon
- Max-Planck Institute for the Chemical Physics of Solids, D 01187 Dresden, Germany
Description
<jats:p> Impressive progress has been made in the processing and exploration of new material on an atomic scale (nanomaterials). However, the characterization of such materials by the usual transmission electron microscopy (TEM) techniques suffers from the drawback that the phase of the object-modulated electron wave is virtually lost in the recorded intensity images. Electron holography has opened possibilities for analyzing both the amplitude and phase of the electron wave, hence giving access to the object information encoded in the phase. Examples include intrinsic electric and magnetic fields, e.g. in ferroelectrics or ferromagnetics, which substantially determine the object properties and therefore are indispensable for a complete understanding of structure-properties relations. </jats:p>
Journal
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- Annual Review of Materials Research
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Annual Review of Materials Research 37 (1), 539-588, 2007-08-01
Annual Reviews
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Details 詳細情報について
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- CRID
- 1363670318960276352
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- ISSN
- 15454118
- 15317331
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- Data Source
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- Crossref