-
- Kwabena E. Bennin
- City University of Hong Kong, Hong Kong
-
- Jacky Keung
- City University of Hong Kong, Hong Kong
-
- Passakorn Phannachitta
- Chiang Mai University, Thailand
-
- Akito Monden
- Okayama University, Japan
-
- Solomon Mensah
- City University of Hong Kong, Hong Kong
書誌事項
- タイトル別名
-
- diversity based oversampling approach to alleviate the class imbalance issue in software defect prediction
- 公開日
- 2018-05-27
- 権利情報
-
- https://www.acm.org/publications/policies/copyright_policy#Background
- DOI
-
- 10.1145/3180155.3182520
- 10.1109/tse.2017.2731766
- 公開者
- ACM
この論文をさがす
説明
Highly imbalanced data typically make accurate predictions difficult. Unfortunately, software defect datasets tend to have fewer defective modules than non-defective modules. Synthetic oversampling approaches address this concern by creating new minority defective modules to balance the class distribution before a model is trained. Notwithstanding the successes achieved by these approaches, they mostly result in over-generalization (high rates of false alarms) and generate near-duplicated data instances (less diverse data). In this study, we introduce MAHAKIL, a novel and efficient synthetic oversampling approach for software defect datasets that is based on the chromosomal theory of inheritance. Exploiting this theory, MAHAKIL interprets two distinct sub-classes as parents and generates a new instance that inherits different traits from each parent and contributes to the diversity within the data distribution. We extensively compare MAHAKIL with SMOTE, Borderline-SMOTE, ADASYN, Random Oversampling and the No sampling approach using 20 releases of defect datasets from the PROMISE repository and five prediction models. Our experiments indicate that MAHAKIL improves the prediction performance for all the models and achieves better and more significant pf values than the other oversampling approaches, based on Brunner's statistical significance test and Cliff's effect sizes. Therefore, MAHAKIL is strongly recommended as an efficient alternative for defect prediction models built on highly imbalanced datasets.
収録刊行物
-
- Proceedings of the 40th International Conference on Software Engineering
-
Proceedings of the 40th International Conference on Software Engineering 44 (6), 699-699, 2018-05-27
ACM
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1360865818709440512
-
- ISSN
- 19393520
- 00985589
-
- データソース種別
-
- Crossref
- OpenAIRE

