Grain detection from 2d and 3d EBSD data—Specification of the MTEX algorithm
収録刊行物
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- Ultramicroscopy
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Ultramicroscopy 111 (12), 1720-1733, 2011-12
Elsevier BV
Ultramicroscopy 111 (12), 1720-1733, 2011-12
Elsevier BV