Field-effect modulated Seebeck coefficient measurements in an organic polymer using a microfabricated on-chip architecture
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- D. Venkateshvaran
- University of Cambridge 1 Optoelectronics Group, Cavendish Laboratory, , Madingley Road, Cambridge CB3 0HE, United Kingdom
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- A. J. Kronemeijer
- University of Cambridge 1 Optoelectronics Group, Cavendish Laboratory, , Madingley Road, Cambridge CB3 0HE, United Kingdom
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- J. Moriarty
- University of Cambridge 1 Optoelectronics Group, Cavendish Laboratory, , Madingley Road, Cambridge CB3 0HE, United Kingdom
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- D. Emin
- University of New Mexico 2 Department of Physics and Astronomy, , 1919 Lomas Blvd. NE, Albuquerque, New Mexico 87131, USA
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- H. Sirringhaus
- University of Cambridge 1 Optoelectronics Group, Cavendish Laboratory, , Madingley Road, Cambridge CB3 0HE, United Kingdom
書誌事項
- 公開日
- 2014-03-01
- 権利情報
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- https://creativecommons.org/licenses/by/3.0/
- https://creativecommons.org/licenses/by/3.0/
- DOI
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- 10.1063/1.4867224
- 公開者
- AIP Publishing
説明
<jats:p>We developed an on-chip microfabricated architecture for high-accuracy gate voltage modulated Seebeck coefficient measurements on an organic field-effect transistor (FET). The microfabricated device comprises integrated heaters and temperature sensors that enable simultaneous Seebeck and FET measurements on devices with practical channel lengths on the order of 50 μm. We exemplify the capabilities of this architecture by investigating the transition from conduction in the semiconductor bulk to conduction in the accumulation layer of a conjugated polymer FET.</jats:p>
収録刊行物
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- APL Materials
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APL Materials 2 (3), 032102-, 2014-03-01
AIP Publishing