Grazing angle x-ray photoemission system for depth-dependent analysis

DOI PDF 被引用文献4件
  • Terrence Jach
    National Institute of Standards and Technology, Gaithersburg, Maryland 20899
  • M. J. Chester
    National Institute of Standards and Technology, Gaithersburg, Maryland 20899
  • S. M. Thurgate
    School of Mathematical and Physical Sciences, Murdoch University, Murdoch 6150, W. A., Australia

説明

<jats:p>We have developed an x-ray photoelectron spectrometer system which combines an adjustable grazing incidence angle source with reflected beam detection. When operated about the critical angle, this combination permits a variation of the x-ray penetration depth which can be monitored by means of the reflectivity. At angles of incidence less than the critical angle, the sampling depth of the photoemission is diminished, but the photoemission from the surface is enhanced due to the constructive interference of the incident and reflected x-ray beams. When used with Mg Kα radiation (Eγ=1253.6 eV), the spectrometry system obtains useful distributions of chemical species in surface layers of 10–40 Å thickness. We present data showing the depth dependence obtained with the spectrometer of different oxides in a sulfide-treated, oxidized GaAs (100) surface.</jats:p>

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