Structural Study of Benzene Adsorbed on Si(001) Surface by Photoelectron Diffraction
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- M. Shimomura
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
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- M. Munakata
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
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- K. Honma
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
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- S. M. Widstrand
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
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- L. Johansson
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
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- T. Abukawa
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
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- S. Kono
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
書誌事項
- 公開日
- 2003-04
- DOI
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- 10.1142/s0218625x03005013
- 公開者
- World Scientific Pub Co Pte Lt
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説明
<jats:p> The structure of benzene adsorbed on a Si(001)(2 × 1) surface up to saturation at room temperature (RT) has been studied by C 1s photoelectron diffraction (PED). Experimental C 1s PED patterns were measured for two regimes of photoelectron kinetic energies at ~ 100 eV and ~ 1000 eV. Simulation of PED patterns was made for three possible structural models predicted so far. Comparison of actual PED patterns and R-factor analysis leads to the conclusion that the so-called standard butterfly (SB) configuration of benzene is present and stable at the saturation coverage at RT. The present PED patterns were not very sensitive to geometrical parameters of absorbed benzene except for the bond length between the topmost carbons in the SB configuration. </jats:p>
収録刊行物
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- Surface Review and Letters
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Surface Review and Letters 10 (02n03), 499-503, 2003-04
World Scientific Pub Co Pte Lt
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詳細情報 詳細情報について
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- CRID
- 1363670320330857728
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- ISSN
- 17936667
- 0218625X
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- データソース種別
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- Crossref
- OpenAIRE
