Very sharp platinum tips for scanning tunneling microscopy

DOI PDF 被引用文献4件
  • L. Libioulle
    Laboratoire de Spectroscopie Moleculaire de Surface, Institute for Studies in Interface Sciences, Facultés Universitaires N.D. de la Paix, Rue de Bruxelles 61, B-5000 Namur, Belgium
  • Y. Houbion
    Unité Interfacultaire de Microscopie Electronique, Institute for Studies in Interface Sciences, Facultés Universitaires N.D. de la Paix, Rue de Bruxelles 61, B-5000 Namur, Belgium
  • J.-M. Gilles
    Laboratoire de Spectroscopie Moleculaire de Surface, Institute for Studies in Interface Sciences, Facultés Universitaires N.D. de la Paix, Rue de Bruxelles 61, B-5000 Namur, Belgium

書誌事項

公開日
1995-01-01
DOI
  • 10.1063/1.1146153
公開者
AIP Publishing

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説明

<jats:p>To achieve both high stability for scanning tunneling microscopy (STM) measurements and well-defined tunnel current localization even on very rough surfaces, we have developed a new electrochemical procedure using CaCl2 etching and H2SO4 micro polishing technique to obtain a very reproducible tip geometry. The mean curvature radius is about 50 Å. The contamination-free platinum tips are usable for a long time as well in air as in ultrahigh vacuum. The tip quality has been tested by STM measurements on gold (111) surfaces and on liquid-crystal films. Tips are stable and provide good STM image in far less time than commonly used tips.</jats:p>

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