Optimization of analysis of soft X-ray spectromicroscopy at the Ca 2p edge
書誌事項
- 公開日
- 2009-06
- 権利情報
-
- https://www.elsevier.com/tdm/userlicense/1.0/
- https://www.elsevier.com/legal/tdmrep-license
- DOI
-
- 10.1016/j.elspec.2009.04.010
- 公開者
- Elsevier BV
この論文をさがす
収録刊行物
-
- Journal of Electron Spectroscopy and Related Phenomena
-
Journal of Electron Spectroscopy and Related Phenomena 173 (1), 44-49, 2009-06
Elsevier BV
