Valence Band Investigations of GaS by Means of Polarized X‐Ray Emission Spectra
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説明
<jats:title>Abstract</jats:title><jats:p>The polarized K‐emission valence band spectra of the layer compound GaS are measured for both the components, Ga and S. For Ga spectra Johanm‐type and double crystal spectrometers are used. All spectra are calculated by the self‐consistent pseudopotential band structure method and also by the X<jats:sub>α</jats:sub>‐scattered‐wave cluster calculation. The calculated and measured spectra are compared and discussed.</jats:p>
収録刊行物
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- physica status solidi (b)
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physica status solidi (b) 131 (1), 193-200, 1985-09
Wiley