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- M. Sobiech
- Max Planck Institute for Metals Research 1 , Heisenbergstrasse 3, D-70569 Stuttgart, Germany
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- M. Wohlschlögel
- Max Planck Institute for Metals Research 1 , Heisenbergstrasse 3, D-70569 Stuttgart, Germany
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- U. Welzel
- Max Planck Institute for Metals Research 1 , Heisenbergstrasse 3, D-70569 Stuttgart, Germany
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- E. J. Mittemeijer
- Max Planck Institute for Metals Research 1 , Heisenbergstrasse 3, D-70569 Stuttgart, Germany
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- W. Hügel
- Robert Bosch GmbH 2 , Dieselstrasse 6, D-72770 Reutlingen, Germany
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- A. Seekamp
- Robert Bosch GmbH 2 , Dieselstrasse 6, D-72770 Reutlingen, Germany
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- W. Liu
- Argonne National Laboratory 3 Advanced Photon Source, , Argonne, Illinois 60439, USA
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- G. E. Ice
- Oak Ridge National Laboratory 4 , Oak Ridge, Tennessee 37831-6118, USA
説明
<jats:p>It has been shown experimentally that local in-plane residual strain gradients occur around the root of spontaneously growing Sn whiskers on the surface of Sn coatings deposited on Cu. The strain distribution has been determined with synchrotron white beam micro Laue diffraction measurements. The observed in-plane residual strain gradients in combination with recently revealed out-of-plane residual strain-depth gradients [M. Sobiech et al., Appl. Phys. Lett. 93, 011906 (2008)] provide the driving forces for whisker growth.</jats:p>
収録刊行物
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- Applied Physics Letters
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Applied Physics Letters 94 (22), 221901-, 2009-06-01
AIP Publishing
