Steady-state photocarrier grating technique for diffusion length measurement in photoconductive insulators

DOI PDF 被引用文献4件
  • D. Ritter
    Solid State Institute and Department of Electrical Engineering, Technion—Israel Institute of Technology, Haifa 32 000, Israel
  • E. Zeldov
    Solid State Institute and Department of Electrical Engineering, Technion—Israel Institute of Technology, Haifa 32 000, Israel
  • K. Weiser
    Solid State Institute and Department of Electrical Engineering, Technion—Israel Institute of Technology, Haifa 32 000, Israel

書誌事項

公開日
1986-09-29
DOI
  • 10.1063/1.97548
公開者
AIP Publishing

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説明

<jats:p>A new simple technique for the determination of the diffusion length in photoconductive insulators is presented. A steady-state photocarrier grating is created by two interfering laser beams, and the magnitude of the secondary photocurrent perpendicular to the grating fringes is measured. The measurement is then repeated when the two beams are incoherent. From a determination of the two photocurrents as a function of grating period the diffusion length of the photocarriers can be obtained. The method can yield accurate results to 5% of the laser wavelength.</jats:p>

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