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SLIC Superpixels Compared to State-of-the-Art Superpixel Methods
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Journal
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- IEEE Transactions on Pattern Analysis and Machine Intelligence
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IEEE Transactions on Pattern Analysis and Machine Intelligence 34 (11), 2274-2282, 2012-11
Institute of Electrical and Electronics Engineers (IEEE)
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Details 詳細情報について
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- CRID
- 1364233268670584192
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- ISSN
- 21609292
- 01628828
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- Data Source
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- Crossref
