Semiautomatic permeance tester for thick magnetic films

DOI PDF 22 Citations
  • Paul A. Calcagno
    IBM Corp., Thomas J. Watson Research Center, P. O. Box 218, Yorktown Heights, New York 10598
  • David A. Thompson
    IBM Corp., Thomas J. Watson Research Center, P. O. Box 218, Yorktown Heights, New York 10598

Search this article

Description

<jats:p>An apparatus has been developed for the measurement of the permeance (effective permeability–thickness product) of magnetic films for frequencies 1–100 MHz and permeances up to 20 000 μ with an accuracy of ±100 μ. This is suitable for permalloy films in the 0.5–5 μ thickness range, which are used in thin film recording heads operating in this frequency range.</jats:p>

Journal

Citations (22)*help

See more

Details 詳細情報について

Report a problem

Back to top