Three-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory Devices
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- Umberto Celano
- IMEC, Kapeldreef 75, B-3001 Heverlee (Leuven), Belgium
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- Ludovic Goux
- IMEC, Kapeldreef 75, B-3001 Heverlee (Leuven), Belgium
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- Attilio Belmonte
- IMEC, Kapeldreef 75, B-3001 Heverlee (Leuven), Belgium
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- Karl Opsomer
- IMEC, Kapeldreef 75, B-3001 Heverlee (Leuven), Belgium
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- Alexis Franquet
- IMEC, Kapeldreef 75, B-3001 Heverlee (Leuven), Belgium
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- Andreas Schulze
- IMEC, Kapeldreef 75, B-3001 Heverlee (Leuven), Belgium
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- Christophe Detavernier
- IMEC, Kapeldreef 75, B-3001 Heverlee (Leuven), Belgium
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- Olivier Richard
- IMEC, Kapeldreef 75, B-3001 Heverlee (Leuven), Belgium
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- Hugo Bender
- IMEC, Kapeldreef 75, B-3001 Heverlee (Leuven), Belgium
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- Malgorzata Jurczak
- IMEC, Kapeldreef 75, B-3001 Heverlee (Leuven), Belgium
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- Wilfried Vandervorst
- IMEC, Kapeldreef 75, B-3001 Heverlee (Leuven), Belgium
収録刊行物
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- Nano Letters
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Nano Letters 14 (5), 2401-2406, 2014-04-10
American Chemical Society (ACS)