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Scaling the Vertical Tunnel FET With Tunnel Bandgap Modulation and Gate Workfunction Engineering
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Journal
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- IEEE Transactions on Electron Devices
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IEEE Transactions on Electron Devices 52 (5), 909-917, 2005-05
Institute of Electrical and Electronics Engineers (IEEE)
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Details 詳細情報について
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- CRID
- 1364233269440616448
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- ISSN
- 00189383
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- Data Source
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- Crossref
