Photoreflectance spectroscopy with a step-scan Fourier-transform infrared spectrometer: Technique and applications

DOI PDF 被引用文献1件
  • Jun Shao
    Chinese Academy of Sciences National Lab for Infrared Physics, Shanghai Institute of Technical Physics, , 200083 Shanghai, China
  • Wei Lu
    Chinese Academy of Sciences National Lab for Infrared Physics, Shanghai Institute of Technical Physics, , 200083 Shanghai, China
  • Fangyu Yue
    Chinese Academy of Sciences National Lab for Infrared Physics, Shanghai Institute of Technical Physics, , 200083 Shanghai, China
  • Xiang Lü
    Chinese Academy of Sciences National Lab for Infrared Physics, Shanghai Institute of Technical Physics, , 200083 Shanghai, China
  • Wei Huang
    Chinese Academy of Sciences National Lab for Infrared Physics, Shanghai Institute of Technical Physics, , 200083 Shanghai, China
  • Zhifeng Li
    Chinese Academy of Sciences National Lab for Infrared Physics, Shanghai Institute of Technical Physics, , 200083 Shanghai, China
  • Shaoling Guo
    Chinese Academy of Sciences National Lab for Infrared Physics, Shanghai Institute of Technical Physics, , 200083 Shanghai, China
  • Junhao Chu
    Chinese Academy of Sciences National Lab for Infrared Physics, Shanghai Institute of Technical Physics, , 200083 Shanghai, China and ECNU-SITP Joint Lab for Image Information, , 200062 Shanghai, China

書誌事項

公開日
2007-01-01
DOI
  • 10.1063/1.2432269
公開者
AIP Publishing

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説明

<jats:p>We report on a new technique of realizing photoreflectance (PR) spectroscopy with a step-scan Fourier-transform infrared spectrometer. The experimental configuration is briefly described and a detailed theoretical analysis is conducted. The results reveal two distinct features of this PR technique that (i) the PR related signal is enhanced by a factor of at least 100 relative to those of the conventional PR techniques and (ii) the unwanted spurious signal introduced by either diffuse reflected pump beam or pump-beam induced material’s photoluminescence reaching the photodetector of the PR configuration is eliminated without any special consideration of normalization for deducing the final PR spectrum. Applications are given as examples in the study of GaNAs/GaAs single quantum wells and GaInP/AlGaInP multiple quantum wells, respectively, under different pump-beam excitation energy and/or power. The experimental results approve the theoretically predicted features and illustrate the possibility of investigating weak PR features by using high pump-beam power. A brief comparison of this technique with the conventional PR techniques is given, and the extendibility of this technique to long-wavelength spectral regions is pointed out.</jats:p>

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