Characterization of Fault Roughness at Various Scales: Implications of Three-Dimensional High Resolution Topography Measurements

詳細情報 詳細情報について

• CRID

  1364233269586759936

• DOI

  10.1007/s00024-009-0521-2

• ISSN

  14209136

  00334553

• Web Site

  http://link.springer.com/content/pdf/10.1007/s00024-009-0521-2.pdf

  http://link.springer.com/article/10.1007/s00024-009-0521-2/fulltext.html

  http://link.springer.com/content/pdf/10.1007/s00024-009-0521-2

• データソース種別

  • Crossref