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A low-temperature dynamic mode scanning force microscope operating in high magnetic fields
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- J. Rychen
- Laboratory of Solid State Physics, ETH Hönggerberg, CH-8093 Zürich, Switzerland
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- T. Ihn
- Laboratory of Solid State Physics, ETH Hönggerberg, CH-8093 Zürich, Switzerland
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- P. Studerus
- Laboratory of Solid State Physics, ETH Hönggerberg, CH-8093 Zürich, Switzerland
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- A. Herrmann
- Laboratory of Solid State Physics, ETH Hönggerberg, CH-8093 Zürich, Switzerland
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- K. Ensslin
- Laboratory of Solid State Physics, ETH Hönggerberg, CH-8093 Zürich, Switzerland
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Description
<jats:p>A scanning force microscope was implemented operating at temperatures below 4.2 K and in magnetic fields up to 8 T. Piezoelectric quartz tuning forks were employed for nonoptical tip–sample distance control in the dynamic operation mode. Fast response was achieved by using a phase-locked loop for driving the mechanical oscillator. Possible applications of this setup for various scanning probe techniques are discussed.</jats:p>
Journal
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- Review of Scientific Instruments
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Review of Scientific Instruments 70 (6), 2765-2768, 1999-06-01
AIP Publishing
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Keywords
Details 詳細情報について
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- CRID
- 1364233270356254464
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- NII Article ID
- 30015945083
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- ISSN
- 10897623
- 00346748
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- Data Source
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- Crossref
- CiNii Articles