Computational Study on the Performance of Multiple-Gate Nanowire Schottky-Barrier MOSFETs

DOI PDF 2 Citations

Mincheol Shin

Journal

IEEE Transactions on Electron Devices

IEEE Transactions on Electron Devices 55 (3), 737-742, 2008-03

Institute of Electrical and Electronics Engineers (IEEE)

Citations (2)*help

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Details 詳細情報について

CRID

1364233270662656896
DOI

10.1109/ted.2008.916149
ISSN

00189383
Web Site

http://xplorestaging.ieee.org/ielx5/16/4455723/04455793.pdf?arnumber=4455793
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