Diamond film characterization by analyzing C 1s peak shapes with X-ray photo-electron spectroscopy.
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- IIJIMA Yoshitoki
- Application and Research Center Electron Optics Division, JEOL Ltd.
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- HIRAOKA Kenzo
- Faculty of Engineering, Yamanashi University
Bibliographic Information
- Other Title
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- X線光電子分光法におけるC1sスペクトル波形解析によるダイヤモンド薄膜の評価
- Xセン コウデンシ ブンコウホウ ニ オケル C1s スペクトル ハケイ カイ
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Abstract
Characterization of diamond films by XPS was carried out by measuring the FWHM (full width at half maximum) and the peak shape of a core C 1s spectrum, and this method was also applied to other carbon films. C 1s peak shapes of natural diamond, graphite carbon, amorphous carbon, glassy carbon, polyethylene (PE) and diamond films formed by the CVD method were analyzed. The C 1s peaks of natural diamond and diamond films showed the same FWHM value, i.e., the diamond films had diamond structure. While the C 1s peak of the natural diamond was symmetric, and those of the other carbon samples were asymmetric. The C 1s peak shape of diamond films was similar to that of amorphous-carbon containing C-H bonds. As a result, it was found that the diamond films contain the C-H bonds in their structure.
Journal
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- BUNSEKI KAGAKU
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BUNSEKI KAGAKU 42 (3), 133-140, 1993
The Japan Society for Analytical Chemistry
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Details 詳細情報について
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- CRID
- 1390001204051866112
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- NII Article ID
- 110002906536
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- NII Book ID
- AN00222633
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- COI
- 1:CAS:528:DyaK3sXktlSqtbs%3D
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- NDL BIB ID
- 3810483
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- ISSN
- 05251931
- http://id.crossref.org/issn/05251931
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- NDL-Digital
- CiNii Articles
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- Abstract License Flag
- Disallowed