NAA of copper contamination in the fabrication of a fluoride optical fiberpreform.

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  • 中性子放射化分析法によるフッ化物光ファイバー母材作製工程における銅汚染の原因について
  • チュウセイシ ホウシャカ ブンセキホウ ニ ヨル フッカブツ ヒカリ ファイバ

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Abstract

NAA was used to determine trace amounts of copper in the raw materials used for fabricating a fluoride optical fiber and its preform. Copper contamination remaining in the preform after fabrication was monitored during the whole preform fabrication process. Copper contamination from the experimental instruments was found to originate from a gold coated brass mold. It was also found that a high contamination of copper in the preform occurred within a thickness of 300μm from its surface.

Journal

  • BUNSEKI KAGAKU

    BUNSEKI KAGAKU 44 (4), 325-329, 1995

    The Japan Society for Analytical Chemistry

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