Determination of components in refractories containing silicon carbide by X-ray fluorescence spectrometry using glass beads.

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  • ASAKURA Hideo
    Research Center,Shinagawa Refractories Co.,Ltd.,707,Imbe,Bizen-shi,Okayama 705-8577
  • IKEGAMI Katsushige
    Research Center,Shinagawa Refractories Co.,Ltd.,707,Imbe,Bizen-shi,Okayama 705-8577
  • YAMADA Yasujiro
    Center for Applied Technology,Rigaku Industrial Corporation,14-8,Akaoji,Takatsuki-shi,Osaka 569-1146
  • WAKITA Hisanobu
    Department of Chemistry,Faculty of Science,Fukuoka University,8-19-1,Nanakuma,Jonan-ku,Fukuoka 814-0133

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Other Title
  • ガラスビード／蛍光Ｘ線分析法による炭化ケイ素含有耐火物中の酸化物成分の定量
  • ガラスビード ケイコウ Xセン ブンセキホウ ニ ヨル タンカ ケイソ ガンユウ タイカブツ チュウ ノ サンカブツ セイブン ノ テイリョウ

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Abstract

The chemical components in refractories containing silicon carbide were determined by an X-ray fluorescence analysis using glass beads.Good-quality glass beads can be prepared by the following method.After 0.3000g of a silicon carbide sample is mixed with 3.0000g of flux(Li2B4O7), the mixture is placed in a Pt-Au alloy dish.It is then fused in a furnace under an O2 atmosphere at 840°C for 33 hours, and finally fused at 1150°C.Since the mass of the resulting glass bead is increased by the oxidation of SiC, which produces SiO2 during sample heating, the ratio of 10:1 between the flux and the sample is changed.For this reason, the popular JIS method of using SiO2-Al2O3 binary calibration curves could not be applied to obtain an accurate analysis with these glass beads.We therefore developed a new calibration method.In this method, the gain on ignition(GOI) is regarded as being a component in the sample, and the theoretical matrix correction coefficients(dj) of each component are calculated by the fundamental parameter procedure(FP procedure) using the GOI as a base component.The GOI-SiO2 binary calibration curves(GOI correction curves) are made with the djs obtained by the FP procedure.With this method the standard deviation(SD) of the GOI correction curves is very satisfactory.Our test results include an SD of 0.24mass% for SiO2 and 0.096mass% for Al2O3.The GOI correction curves are applicable to all components in the reference materials, except for Fe2O3.

Journal

  • BUNSEKI KAGAKU

    BUNSEKI KAGAKU 49 (5), 297-306, 2000

    The Japan Society for Analytical Chemistry

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