酸化物ターゲットを用いたDCスパッタITO膜

  • 木村 浩
    三井金属鉱業株式会社・電子材料研究所 三井金属鉱業株式会社新金属事業部・三池レアメタル工場
  • 渡辺 弘
    三井金属鉱業株式会社・電子材料研究所
  • 石原 哲
    三井金属鉱業株式会社・電子材料研究所
  • 鈴木 義雄
    真空器械工業株式会社
  • 伊東 孝
    真空器械工業株式会社

書誌事項

タイトル別名
  • DC magnetron sputtered ITO films applied with indium tin oxide targets.
  • サンカブツ ターゲット オ モチイタ DC スパッタ ITO マク

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説明

Indium tin oxide (ITO) films were deposited by DC magnetron sputtering using ITO targets. Low resistivity of 1.4×10-4 Ω·cm and high transmittance of 85% at 550 nm were obtained under optimum conditions, depending on a SnO2 content (020 wt.%) in the ITO targets, substrate temperature, and oxygen partial pressure. Films with the low resistivity can be obtained in rather wide sputtering conditions in comparison with in using metal targets. Due to a change in the sputtering conditions, especially the substrate temperature, the optimum SnO2 content in the target was changed. When the substrate was at room temperature, the film with a resistivity of 4.0×10-4 Ω ·cm was prepared for the target of 5 wt.%SnO2, and at 400°C a film with 1.4×10-4 Ω·cm was prepared for the target with 10 wt.%SnO2, with good reproducibility. In these cases, decreasing of SnO2 content in the films was found and (400) preferential orientation of indium oxide (In2O3) was observed in the films by X-ray diffraction technique.

収録刊行物

  • 真空

    真空 30 (6), 546-554, 1987

    一般社団法人 日本真空学会

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