Simultaneous Spectral Measurement for a Twin Wavelength Rigions using High Order Diffraction Spectra of a Grating

DOI Web Site Web Site
  • Ohkubo Kazuaki
    Lighting Research Laboratory, Matsushita Electric Industrial Co., Ltd.

Bibliographic Information

Other Title
  • 回折格子モノクロメータの高次回折光を利用した2波長域同時分光測定
  • カイセツ コウシ モノクロメータ ノ コウジ カイセツ ヒカリ オ リヨウシタ

Search this article

Description

An attempt was made to develop a method to measure simultaneously for twin wavelength regions (from 400 nm to 750 nm and from 700 nm to 2500 nm) using first and second orders diffraction spectra of a grating.<BR>The second order diffraction spectrum of a grating, whose first order diffraction spectrum was used for the infrared spectral measurement, was able to be measured precisely for the visible spectrum of light sources.<BR>First and second order diffraction spectra of a grating were separated from each other with a cold mirror, so that the visible and infrared spectrum of a light source were able to be measured simultaneously.<BR>As a result, visible and infrared spectral measurement was carried out efficiently and precisely with a infrared grating monochromator.

Journal

Keywords

Details 詳細情報について

Report a problem

Back to top