白色Ｘ線ペンデルビート法による結晶構造因子の測定

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タイトル別名
  • Structure factor determination by the Pendelloesung-beats measurement using white radiation.
  • ハクショク Xセン ペンデルビートホウ ニ ヨル ケッショウ コウゾウ インシ

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抄録

This paper describes the new techniques of measuring the Pendellosung beats using white radiation with the energy-dispersive diffraction method. Two techniques have been developed in the author's laboratory on the basis of the dynamical diffraction theory, in which the intensity of a Laue spot diffracted from a parallel-sided single crystal is successively measured at different Bragg angles, i.e., with different wavelengths. In the fast method, the integrated intensity diffracted from the whole exit area is measured and in the second case, the measurement is made only at the center of the Borrmann fan. A discussion is made on the advantage points as well as on the accuracy of these methods in the structure factor determination.

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