書誌事項
- タイトル別名
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- Structure of CaF2/Si(111) Interface.
- Si 111 メンジョウ CaF2 ハクマク ノ カイメン コウゾウ
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The structure of the CaF2/Si (111) interface has been investigated with the use of X-ray crystal truncation rod scattering. The T -site which is just above the first layer Si atom is occupied by an interfacial Ca atom for a type-A interface as well as for a type-B interface. Structural parameters, describing the interface and the structure of the thin film have also been obtained and discussed thoroughly. Crystallinity of the type-A epilayer and that of the type-B epilayer has been compared. For type-B thin film, there is an evidence that a shortinterface-spacing-structure is not an equilibrium state, but can transform to a long-interfacespacing-structure. We are able to gain insight into a possibility that the type-A structure can also transform to a different structure.
収録刊行物
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- 日本結晶学会誌
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日本結晶学会誌 38 (6), 400-406, 1996
日本結晶学会
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詳細情報 詳細情報について
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- CRID
- 1390001204085894784
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- NII論文ID
- 10002025446
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- NII書誌ID
- AN00188364
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- COI
- 1:CAS:528:DyaK2sXis1Crt7k%3D
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- ISSN
- 18845576
- 03694585
- http://id.crossref.org/issn/03694585
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- NDL書誌ID
- 4170864
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可