High-resolution Z-contrast Imaging by the HAADF-STEM Method
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- SAITOH Koh
- Ecotopia Science Institute, Nagoya University
Bibliographic Information
- Other Title
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- 電子線で今何ができるか1.電子線結晶構造解析の最先端 HAADF‐STEM法による高分解能Zコントラスト像観察
- HAADF STEMホウ ニ ヨル コウ ブンカイノウ Zコントラストゾウ カンサツ
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Description
Characteristic features of the high-angle annular dark-field scanning transmission electron microscope method are described from an experimental viewpoint. Examples of experimental HAADF-STEM images are shown.
Journal
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- Nihon Kessho Gakkaishi
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Nihon Kessho Gakkaishi 47 (1), 9-14, 2005
The Crystallographic Society of Japan
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Details 詳細情報について
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- CRID
- 1390001204087175680
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- NII Article ID
- 10014463309
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- NII Book ID
- AN00188364
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- ISSN
- 18845576
- 03694585
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- NDL BIB ID
- 7266190
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed