Electrostatic Potential Analysis Using Convergent-Beam Electron Diffraction

DOI Web Site 1 Citations 36 References
  • TSUDA Kenji
    Center for Advanced Microscopy and Spectroscopy, Institute of Multidisciplinary Research for Advanced Materials, Tohoku University

Bibliographic Information

Other Title
  • 収束電子回折法による静電ポテンシャル分布解析
  • シュウソク デンシ カイセツホウ ニ ヨル セイデンポテンシャル ブンプ カイセキ

Search this article

Abstract

A nanoscale structure analysis method using convergent-beam electron diffraction (CBED) is described, which enables us to directly determine electrostatic potential. Applications of the method to crystalline silicon and spinel oxide FeCr2O4 are presented.

Journal

Citations (1)*help

See more

References(36)*help

See more

Related Projects

See more

Details 詳細情報について

Report a problem

Back to top