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- 神谷 信夫
- 理化学研究所播磨研究所
書誌事項
- タイトル別名
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- Development of an Imaging-Plate X-Ray Diffractometer for Rapid Measurement with a Laboratory Source.
- ジッケンシツケイ ジンソク Xセン カイセツ ソウチ ノ カイハツ
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A new imaging-plate X-ray diffractometer of the Weissenberg-camera type with an ad-justable multilayer-line screen system (IPD-WAS) has been developed. Prior to data collection, IPD-WAS automatically aligns an axis of a sample crystal and sets the multilayer-line (MLL) screens. For Weissenberg photography, IPD-WAS system uses two cylindrical imaging plates (IPs) . The IPs are read by a rotary readout mechanism. Owing to the good performance of the adjustable MLL screen system and the rotary readout mechanism, IPD-WAS achieves a data acquisition time of about one hour with reflection data of sufficient quality, which is suitable for time-resolved X-ray crystallography. IPD-WAS also enables faster crystal structure determinations of small molecules, including unstable crystals.
収録刊行物
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- 日本結晶学会誌
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日本結晶学会誌 41 (3), 167-174, 1999
日本結晶学会
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詳細情報 詳細情報について
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- CRID
- 1390001204087574784
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- NII論文ID
- 10005097598
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- NII書誌ID
- AN00188364
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- ISSN
- 18845576
- 03694585
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- NDL書誌ID
- 4800373
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可