Time-Resolved X-ray Structural Investigation for Amorphous-Crystal Phase Change Process of DVD Optical Memory Materials

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  • ＤＶＤ相変化材料の時分割構造解析
  • DVD ソウ ヘンカ ザイリョウ ノ ジブンカツ コウゾウ カイセキ

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Abstract

A time-resolved structural investigation of the data storage process in a digital versatile disk (DVD) media has been desired for better understanding of the fast phase-change mechanism to get a clue in designing of higher performance optical recording material. Thus, the development of an in situ structural observation technique in the level of picosecond has been carried out for the investigation of the fast phase-change phenomena, by using synchrotron radiation pulsed X-rays and synchronized femtosecond laser irradiation. Then, for Ge2Sb2Te5 and Ag3.5In3.8Sb75.0Te17.7, the technique has been applied to a snapshot of X-ray diffraction observation of nanosecond crystallization process from amorphous to crystal phase which corresponds to erasing process of DVD recording system. The details of the time-resolved X-ray diffraction apparatus coupled with in situ photoreflectivity measurement and its performance are described.

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