Phenomenon of End of Life in a Fluorescent Lamp under High-Frequency Operation

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  • 高周波点灯時における蛍光ランプの寿命末期現象
  • コウシュウハ テントウジ ニオケル ケイコウ ランプ ノ ジュミョウ マッキ ゲンショウ

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Abstract

The mechanism that causes the end of lamp life (EOLL) phenomenon in a fluorescent lamp should be clarified to better understand the EOLL. The phenomenon, including the tungsten sputtering from an electrode, is investigated. We observed the electron emission from a lead in the vicinity of the stem glass resulting in the intermittent pulse discharge that heated up the stem glass. The comparison of the stem glass resistance and the glow discharge impedance at an interval of leads after disconnection of the filament indicates whether or not the stem glass will begin to soften. It was shown that the heating of a small glass portion around the lead by the intermittent pulse discharge or the concentration of discharge current into one of leads was a dominant factor that resulted in the final stage of EOLL.

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