Phenomenon of End of Life in a Fluorescent Lamp under High-Frequency Operation
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- Myojo Minoru
- Matsushita Electric Industrial Co., Ltd.
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- Fukumasa Osamu
- Yamaguchi University
Bibliographic Information
- Other Title
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- 高周波点灯時における蛍光ランプの寿命末期現象
- コウシュウハ テントウジ ニオケル ケイコウ ランプ ノ ジュミョウ マッキ ゲンショウ
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Description
The mechanism that causes the end of lamp life (EOLL) phenomenon in a fluorescent lamp should be clarified to better understand the EOLL. The phenomenon, including the tungsten sputtering from an electrode, is investigated. We observed the electron emission from a lead in the vicinity of the stem glass resulting in the intermittent pulse discharge that heated up the stem glass. The comparison of the stem glass resistance and the glow discharge impedance at an interval of leads after disconnection of the filament indicates whether or not the stem glass will begin to soften. It was shown that the heating of a small glass portion around the lead by the intermittent pulse discharge or the concentration of discharge current into one of leads was a dominant factor that resulted in the final stage of EOLL.
Journal
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- JOURNAL OF THE ILLUMINATING ENGINEERING INSTITUTE OF JAPAN
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JOURNAL OF THE ILLUMINATING ENGINEERING INSTITUTE OF JAPAN 87 (8), 566-575, 2003
The Illuminating Engineering Institute of Japan
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Details 詳細情報について
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- CRID
- 1390001204087821824
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- NII Article ID
- 130006767557
- 110001143303
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- NII Book ID
- AN00268860
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- ISSN
- 1349838X
- 21851506
- 00192341
- http://id.crossref.org/issn/00192341
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- NDL BIB ID
- 6658289
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- Data Source
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- JaLC
- IRDB
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed