書誌事項
- タイトル別名
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- Three-Dimensional X-ray Topography and Its Applications
- Xセン トポグラフィ ノ サンジゲンカ ト オウヨウ
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抄録
The lattice defects in bulky crystals have three-dimensional distribution. The evaluation technique should provide three-dimensional information of these defects. X-ray topography is the only way to nondestructively characterize the defects in the single crystals with high sensitivity to strain. However, a laboratory X-ray source is too weak to get three-dimensional information by X-ray topography. Synchrotron light source showed the possibility of three-dimensional X-ray topography with its performance. In this report, we describe the techniques of three-dimensional X-ray topography and its applications at SPring-8.
収録刊行物
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- 日本結晶学会誌
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日本結晶学会誌 54 (1), 12-17, 2012
日本結晶学会
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詳細情報 詳細情報について
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- CRID
- 1390001204090269440
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- NII論文ID
- 10030264836
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- NII書誌ID
- AN00188364
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- BIBCODE
- 2012NKG....54...12K
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- COI
- 1:CAS:528:DC%2BC38XmtlWqsLk%3D
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- ISSN
- 18845576
- 03694585
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- NDL書誌ID
- 023566489
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可