Photoluminescence in a Thermally Activated Delayed Fluorescence Emitter for Organic Light-emitting Diodes
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- NIWA Akitsugu
- Department of Physics and Electronics, Osaka Prefecture University
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- TAKAKI Kensho
- Department of Physics and Electronics, Osaka Prefecture University
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- KOBAYASHI Takashi
- Department of Physics and Electronics, Osaka Prefecture University The Research Institute for Molecular Electronic Devices (RIMED)
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- NAGASE Takashi
- Department of Physics and Electronics, Osaka Prefecture University The Research Institute for Molecular Electronic Devices (RIMED)
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- GOUSHI Kenichi
- Center for Organic Photonics and Electronics Research (OPERA), Kyushu University JST, ERATO, Adachi Molecular Exciton Engineering Project International Institute for Carbon Neutral Energy Research (WPI-I<sup>2</sup> CNER), Kyushu University
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- ADACHI Chihaya
- Center for Organic Photonics and Electronics Research (OPERA), Kyushu University JST, ERATO, Adachi Molecular Exciton Engineering Project International Institute for Carbon Neutral Energy Research (WPI-I<sup>2</sup> CNER), Kyushu University
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- NAITO Hiroyoshi
- Department of Physics and Electronics, Osaka Prefecture University The Research Institute for Molecular Electronic Devices (RIMED)
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説明
Thermally activated delayed fluorescence (TADF) has attracted much attention for realization of highly-efficient and low-cost organic light emitting diodes (OLEDs). OLEDs based on 1,2,3,5-tetrakis(carbazol-9-yl)-4,6-dicyanobenzene (4CzIPN), which is one of highly-efficient TADF emitters, have been demonstrated to exhibit external quantum efficiency more than 19%. To study the decay rates from excited states of 4CzIPN, the temperature dependence of photoluminescence quantum efficiency (PLQE) has been measured in the weak photoexcitation limit in 4CzIPN-doped 1,3-bis(9-carbazolyl)benzene thin films. Characteristic features of the temperature dependence of PLQE in the weak photoexcitation limit are found, and examined by using rate equations of singlet and triplet densities.
収録刊行物
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- 日本画像学会誌
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日本画像学会誌 55 (2), 143-148, 2016
一般社団法人 日本画像学会
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詳細情報 詳細情報について
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- CRID
- 1390001204097727360
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- NII論文ID
- 130005144932
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- NII書誌ID
- AA1137305X
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- ISSN
- 18804675
- 13444425
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- NDL書誌ID
- 027294845
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- CiNii Articles
- KAKEN
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- 抄録ライセンスフラグ
- 使用不可