Empty-and Filled-Electronic States of the Si(111)〓3×〓3-Sn,〓3×〓3-In and 2〓3×2〓3-Sn Surfaces
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- Kinoshita Toyohiko
- Department of Physics, Faculty of Science, Tohoku University
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- Ohta Hiroshi
- Department of Physics, Faculty of Science, Tohoku University
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- Enta Yoshiharu
- Department of Physics, Faculty of Science, Tohoku University
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- Yaegashi Yukou
- Department of Physics, Faculty of Science, Tohoku University
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- Suzuki Shoji
- Department of Physics, Faculty of Science, Tohoku University
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- Kono Shozo
- Department of Physics, Faculty of Science, Tohoku University
書誌事項
- タイトル別名
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- Empty- and Filled-Electronic States of the Si(111)\sqrt3×\sqrt3-Sn, \sqrt3×\sqrt3-In and 2\sqrt3×2\sqrt3-Sn Surfaces
- Empty-and Filled Electronic States of t
- Empty- and Filled-Electronic States of the Si(111)\(\sqrt{3}\times \sqrt{3}\)-Sn, \(\sqrt{3}\times \sqrt{3}\)-In and \(2\sqrt{3}\times 2\sqrt{3}\)-Sn Surfaces
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抄録
Momentum-resolved inverse photoemission spectra have been measured for Si(111) \sqrt3×\sqrt3-Sn and -In surfaces. An empty part of the metallic surface-state band for \sqrt3×\sqrt3-Sn is observed. It is noted that the metallic band (including the empty and filled parts) for the \sqrt3×\sqrt3-Sn surface disperses in the same manner as the empty band for the \sqrt3×\sqrt3-In surface. This is consistent with the previous proposal that the atomic arrangements of the \sqrt3×\sqrt3-Sn and \sqrt3×\sqrt3-column III surfaces are identical to each other. For the Si(111)2\sqrt3×2\sqrt3-Sn surface, momentum-resolved inverse photoemission spectra and coverage-dependent angle-resolved photoemission spectra have been measured. It has been found that the 2\sqrt3×2\sqrt3-Sn surface is semiconducting and at least two filled- and one empty-surface-state bands exist in the bulk band gap.
収録刊行物
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- Journal of the Physical Society of Japan
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Journal of the Physical Society of Japan 56 (11), 4015-4021, 1987
一般社団法人 日本物理学会
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詳細情報 詳細情報について
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- CRID
- 1390001204185830144
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- NII論文ID
- 110001976218
- 210000093675
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- NII書誌ID
- AA00704814
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- BIBCODE
- 1987JPSJ...56.4015K
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- COI
- 1:CAS:528:DyaL1cXhsFyntr0%3D
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- ISSN
- 13474073
- 00319015
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- NDL書誌ID
- 3151873
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可