Diffuse Scattering in the High-Temperature(1×1) State of Si(111)
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- Iwasaki Hiroshi
- The Institute of Scientific and Industrial Research, Osaka University
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- Hasegawa Shigehiko
- The Institute of Scientific and Industrial Research, Osaka University
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- Akizuki Makoto
- The Institute of Scientific and Industrial Research, Osaka University
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- Li Sung-Te
- The Institute of Scientific and Industrial Research, Osaka University
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- Nakamura Shogo
- The Institute of Scientific and Industrial Research, Osaka University
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- Kanamori Junjiro
- Department of Physics, Faculty of Science, Osaka University
書誌事項
- タイトル別名
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- Diffuse Scattering in the High Temperat
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Diffuse spots slightly displaced from the (\sqrt3×\sqrt3) positions were observed in the high-temperature (1×1) state of Si (111) by low-energy electron diffraction. The spots showed threefold 3m symmetry and rotated around the \sqrt3 positions with changes in primary energy. These are reproduced by kinematic calculations for a surface configuration with adatoms distributed randomly over both the threefold-hollow and threefold atop sites of a (1×1) substrate with the exclusion of forming bonds with a common substrate atoms.
収録刊行物
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- Journal of the Physical Society of Japan
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Journal of the Physical Society of Japan 56 (10), 3425-3428, 1987
一般社団法人 日本物理学会
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詳細情報 詳細情報について
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- CRID
- 1390001204186280192
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- NII論文ID
- 110001960168
- 210000093580
- 130003899254
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- NII書誌ID
- AA00704814
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- BIBCODE
- 1987JPSJ...56.3425I
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- COI
- 1:CAS:528:DyaL1cXmtlSrsw%3D%3D
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- ISSN
- 13474073
- 00319015
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- NDL書誌ID
- 3151743
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可