Raman Scattering from Anisotropic Phonon Modes in SiC Polytypes
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- Nakashima Shin-ichi
- Department of Applied Physics, Osaka University
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- Wada Atsuo
- Department of Applied Physics, Osaka University
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- Inoue Zenzaburo
- National Institute for Research in Inorganic Materials
書誌事項
- タイトル別名
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- Raman Scattering from Anisotropic Phono
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Frequency difference between planar and axial type modes in transverse optical phonons has been studied in various SiC polytypes by Raman scattering. The degree of the anisotropy in the phonon frequency is closely correlated with percent of the hexagonal stacking in polytypes. It is confirmed experimentally that the proportionality between the anisotropy and hexagonality holds for all the polytypes identified by X-ray analysis. The calculation under the assumption that the interplanar force constant differs for hexagonal and cubic environments has explained this relationship. These results suggest that the hexagonality of unidentified polytypes with longer period can be determined from Raman measurements of the anisotropy. Optical phonons in 2H-SiC have also been examined and their frequencies have been obtained.
収録刊行物
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- Ｊｏｕｒｎａｌ ｏｆ ｔｈｅ Ｐｈｙｓｉｃａｌ Ｓｏｃｉｅｔｙ ｏｆ Ｊａｐａｎ
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Ｊｏｕｒｎａｌ ｏｆ ｔｈｅ Ｐｈｙｓｉｃａｌ Ｓｏｃｉｅｔｙ ｏｆ Ｊａｐａｎ 56 (9), 3375-3380, 1987
一般社団法人 日本物理学会
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詳細情報 詳細情報について
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- CRID
- 1390001204187833216
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- NII論文ID
- 110001976340
- 130003739980
- 210000093567
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- NII書誌ID
- AA00704814
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- BIBCODE
- 1987JPSJ...56.3375N
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- COI
- 1:CAS:528:DyaL2sXmt1GisLo%3D
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- ISSN
- 13474073
- 00319015
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- NDL書誌ID
- 3139605
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可