Quantitative and chemical-state analyses of surface oxygen on graphite oxides using total-electron-yield soft X-ray absorption spectroscopy
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- Muramatsu Yasuji
- Graduate School of Engineering, University of Hyogo
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- Ueda Satoshi
- Graduate School of Engineering, University of Hyogo
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- Gullikson Eric M.
- Lawrence Berkeley National Laboratory
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説明
A new quantitative and chemical-state analysis method to measure oxygen on the surface of graphitic carbon materials by total-electron-yield soft X-ray absorption spectroscopy (TEY-XAS) is proposed, and applied to the analysis of graphite oxides (GO). In this method, working curves for quantitative analysis were successfully obtained from the relative absorption- peak-intensity in the OK and CK absorption edges as functions of the O/C atomic ratio in standard organic samples which have various oxygenated functional groups. The atomic ratio O/C on the GO surface was determined as approximately 0.35 from the working curves, and the chemical states of surface oxygen were estimated as mainly –OH and partially >C=O and/or –CH=O from the finger print method of the TEY-XAS.
収録刊行物
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- 炭素
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炭素 2009 (236), 9-14, 2009
炭素材料学会
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詳細情報 詳細情報について
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- CRID
- 1390001204227247744
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- NII論文ID
- 10025165130
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- NII書誌ID
- AN00140335
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- ISSN
- 18845495
- 03715345
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- NDL書誌ID
- 9796847
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDLサーチ
- Crossref
- CiNii Articles
- OpenAIRE
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- 抄録ライセンスフラグ
- 使用不可