Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers
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- Sawada Daisuke
- Graduate School of Engineering, Osaka University
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- Hirai Akira
- Graduate School of Engineering, Osaka University
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- Sugimoto Yoshiaki
- Graduate School of Engineering, Osaka University
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- Abe Masayuki
- Graduate School of Engineering, Osaka University PRESTO, Japan Science and Technology Agency
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- Morita Seizo
- Graduate School of Engineering, Osaka University
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Abstract
Imaging of surface atoms with simultaneous measurement of noncontact atomic force microscopy (NC-AFM) and scanning tunneling microscopy (STM) is performed. Si cantilever coated with PtIr provides stable AFM/STM operations to obtain high spatial resolution images. AFM/STM measurements on Si(111)-(7×7), Ge(111)-c(2×8), and TiO2(110) surfaces are presented at room temperature. On the Ge(111)-c(2×8) surface, adatom and restatom sites which have the same atomic patterns are determined from dual bias AFM/STM measurements.
Journal
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- MATERIALS TRANSACTIONS
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MATERIALS TRANSACTIONS 50 (5), 940-942, 2009
The Japan Institute of Metals and Materials
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Keywords
Details 詳細情報について
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- CRID
- 1390001204249403648
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- NII Article ID
- 10024814113
- 130004454240
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- NII Book ID
- AA1151294X
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- ISSN
- 13475320
- 13459678
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- NDL BIB ID
- 10213868
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed