Long Time Stability of Pb-Free Sn-9Zn Elements for AC-Low Voltage Fuse Performance
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- Matsugi Kazuhiro
- Area of Mechanical Material Engineering, Graduate School of Engineering, Hiroshima University
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- Iwashita Yasuhiro
- Area of Mechanical Material Engineering, Graduate School of Engineering, Hiroshima University
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- Choi Yong-Bum
- Area of Mechanical Material Engineering, Graduate School of Engineering, Hiroshima University
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- Sasaki Gen
- Area of Mechanical Material Engineering, Graduate School of Engineering, Hiroshima University
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- Fujii Koji
- The Chugoku Electric Power Co. Inc.
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In order to evaluate the stability in long time for the performance of AC-low voltage fuses, this study aimed to measure the changes of the specific resistivity, specific heat and thermal conductivity due to the microstructure-change, using a diffusion couple consisting of the Sn-9Zn fuse element and Cu-connector which are exposed at 443 K for 7.2 ks. The reaction area with the thickness of 5 μm consisting of Sn, Cu and Zn phases, was formed at its interface. The values in their properties were increased due to microstructure-change caused by the diffusion. The equations for the estimation of their values could be represented as a function of temperature. The good stability in long time for the un-melt down performance at 210 A of electric current, was confirmed by three-dimensional voltage and temperature calculations on fuse elements after diffusion.
収録刊行物
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- MATERIALS TRANSACTIONS
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MATERIALS TRANSACTIONS 52 (4), 753-758, 2011
公益社団法人 日本金属学会
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詳細情報 詳細情報について
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- CRID
- 1390001204249590144
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- NII論文ID
- 10028175503
- 130004454698
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- NII書誌ID
- AA1151294X
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- COI
- 1:CAS:528:DC%2BC3MXovVyqur4%3D
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- ISSN
- 13475320
- 13459678
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- NDL書誌ID
- 11058364
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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- 使用不可