X-ray Diffraction Analysis of the Recrystallization Behavior of SiC<SUB>w</SUB>/Al Composite at High Temperature

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  • Jiang Chuan-hai
    School of Materials Science and Engineering, Shanghai Jiao Tong University
  • Ye Chang-qing
    School of Materials Science and Engineering, Shanghai Jiao Tong University
  • Hong Bo
    School of Materials Science and Engineering, Shanghai Jiao Tong University

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  • X-ray Diffraction Analysis of the Recrystallization Behavior of SiCw/Al Composite at High Temperature

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Abstract

By using the method of in-situ X-ray diffraction and profile analysis, the variation of grain size and microstrain of the cold-rolled SiCw/Al composite at high temperature was measured, and the recrystallization behavior of the composite was investigated. Test results showed that the activation energy of grain growth after recrystallization and recovery at higher temperature of matrix in composite is close to the activation energy for self-diffusion of pure Al. It was verified that the recovery phenomenon was accompanied with the grain growth, and the whiskers cannot affect the grain growth and recovery of matrix in composite at higher temperature.

Journal

  • MATERIALS TRANSACTIONS

    MATERIALS TRANSACTIONS 46 (10), 2125-2128, 2005

    The Japan Institute of Metals and Materials

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