Four-Dimensional Morphological Evolution of an Aluminum Silicon Alloy Using Propagation-Based Phase Contrast X-ray Tomographic Microscopy

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  • Gulsoy Emine Begum
    Department of Materials Science and Engineering, Northwestern University
  • Shahani Ashwin J.
    Department of Materials Science and Engineering, Northwestern University
  • Gibbs John W.
    Department of Materials Science and Engineering, Northwestern University
  • Fife Julie L.
    Swiss Light Source, Paul Scherrer Institut
  • Voorhees Peter W.
    Department of Materials Science and Engineering, Northwestern University Swiss Light Source, Paul Scherrer Institut

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Four-dimensional propagation-based phase contrast X-ray tomographic microscopy experiments were performed on an Aluminum-29.9 mass% Silicon alloy during coarsening. Using propagation-based phase contrast, changes in the three-dimensional morphology of primary silicon particles were captured and the resulting evolution of the microstructure is discussed. While morphologies at earlier times are complex, faceted and highly interconnected, the morphologies at later times are less faceted but remain quite complex.

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