Strain Measurement of Micrometre-Sized Structures under Tensile Loading by Using Scanning White-Light Interferometry
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- Ito Takashi
- Department of Materials Science and Engineering, Graduate School of Science and Technology, Kumamoto University
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- Mine Yoji
- Department of Materials Science and Engineering, Graduate School of Science and Technology, Kumamoto University
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- Otsu Masaaki
- Department of Mechanical Engineering, Graduate School of Engineering, University of Fukui
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- Takashima Kazuki
- Department of Materials Science and Engineering, Graduate School of Science and Technology, Kumamoto University
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<p>A scanning white-light interferometry (SWLI) technique was used to image the surface topography and measure the in-plane strain in micrometre-sized structures subjected to uniaxial tensile deformation. This technique was applied to observing the macro and local deformation behaviours in micrometre-sized Au specimens. Reproducible stress–strain curves were successfully obtained using SWLI during the intermittent tensile tests. The local strain distribution was also calculated from the movement of natural gauge marks that are characteristic of triangular elements. Combining this micro-tensile test with orientation imaging microscopy enables crystal plasticity of mesoscale structures to be revealed.</p>
収録刊行物
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- MATERIALS TRANSACTIONS
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MATERIALS TRANSACTIONS 57 (8), 1252-1256, 2016
公益社団法人 日本金属学会
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詳細情報 詳細情報について
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- CRID
- 1390001204253373696
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- NII論文ID
- 130005165735
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- NII書誌ID
- AA1151294X
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- ISSN
- 13475320
- 13459678
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- NDL書誌ID
- 027512352
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- 使用不可