Standardization of Excitation Efficiency in Near-field Scanning Optical Microscopy

MITSUI Tadashi, IMANAKA Yasutaka, TAKEHANA Kanji, TAKAMASU Tadashi, NAKAJIMA Ken, KIM Jeongyong

doi:10.2116/analsci.27.139

Standardization of Excitation Efficiency in Near-field Scanning Optical Microscopy

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MITSUI Tadashi

Nanophysics Group, Quantum Dot Research Center, National Institute for Materials Science
IMANAKA Yasutaka

Nanophysics Group, Quantum Dot Research Center, National Institute for Materials Science
TAKEHANA Kanji

Nanophysics Group, Quantum Dot Research Center, National Institute for Materials Science
TAKAMASU Tadashi

Nanophysics Group, Quantum Dot Research Center, National Institute for Materials Science
NAKAJIMA Ken

WPI Advanced Institute for Materials Research, Tohoku University
KIM Jeongyong

Department of Physics, University of Incheon

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抄録

Near-field scanning optical microscope (NSOM or SNOM) is a form of scanning probe microscope (SPM), which is used to observe the optical properties of a sample surface with a nanometer-scale spatial resolution. Since the near-field light strongly interacts with the sample surface, or with nanometer-scale objects on the substrate’s surface, NSOM is advantageous to excite only the vicinity of a sample surface. From the view point of surface chemical analysis, a discussion about the light energy concentration within a nanometer-scale region, and an estimation of its efficiency are indispensable for accurate measurements of the optical properties in a nanometer-scale region. In this paper, we describe the concept, the cautions and the general guidelines of a method to measure the excitation efficiency of aperture-type NSOM instruments.