Investigation of elemental analysis in plants by the X-ray (fluorescence) fundamental parameter method.

DOI Web Site 1 Citations 20 References

Bibliographic Information

Other Title
  • ファンダメンタル・パラメータ法を利用した蛍光X線分析法による植物の元素分析とその有効性
  • ファンダメンタル パラメータホウ オ リヨウシタ ケイコウ Xセン ブンセキホ

Search this article

Description

X-ray fluorescence analysis (XRF) has been widely used for elemental analysis in the field of quality control and research, since it allows non-destructive analysis and sample preparation is easy. In general, quantitative analysis is carried out using a calibration curve obtained from many standard samples. However, for some applications such as analysis of plant samples, it may be difficult to prepare standard materials. The recent development of the fundamental parameter method (FP method) makes it possible to perform quantitative analysis using only a few standards or reference samples. In the qualitative analysis program, semiquantitative results can be calculated using the X-ray intensities for the detected elements. The recent application of XRF to plant analysis using the FP method is discussed.

Journal

Citations (1)*help

See more

References(20)*help

See more

Keywords

Details 詳細情報について

Report a problem

Back to top