Effect of Dielectric Behavior of Gate Dielectric Polymers on Memory Characteristics of Organic Field-effect Transistors
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- Sakai Heisuke
- Flexible Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST)
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- Cheong Hae-Jeong
- Flexible Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST)
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- Kodzasa Takehito
- Flexible Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST)
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- Tokuhisa Hideo
- Flexible Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST)
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- Tokoro Kazuhiko
- Flexible Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST)
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- Yoshida Manabu
- Flexible Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST)
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- Ikoga Taihei
- Department of Image and Materials Science, Graduate School of Advanced Integration Science, Chiba University
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- Nakamura Kazuki
- Department of Image and Materials Science, Graduate School of Advanced Integration Science, Chiba University
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- Kobayashi Norihisa
- Department of Image and Materials Science, Graduate School of Advanced Integration Science, Chiba University
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- Uemura Sei
- Department of Image and Materials Science, Graduate School of Advanced Integration Science, Chiba University
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抄録
Memory characteristics of organic field-effect transistors (OFETs) fabricated using poly(γ-methyl-L-glutamate) (PMLG) and poly(ε-benzyloxycarbonyl-L-lysine) [PLys(z)] as gate dielectrics are investigated. The origin of difference in the memory retention property in the transfer characteristics of the OFETs is investigated by thermally stimulated depolarized current (TSDC) and dielectric spectra measurements for the PLys(z) and PMLG films. TSDC measurements reveal that the depolarization of the PLys(z) film is mainly dominated by a single relaxation process around room temperature, but that of the PMLG film is not dominated by a relaxation process. Further, the PLys(z) film shows dielectric dispersion near room temperature, but the PMLG film does not show any dispersion. This causes difference in the electric characteristics of OFETs.
収録刊行物
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- Journal of Photopolymer Science and Technology
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Journal of Photopolymer Science and Technology 27 (3), 333-337, 2014
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詳細情報 詳細情報について
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- CRID
- 1390001204324955520
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- NII論文ID
- 130004687586
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- NII書誌ID
- AA11576862
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- ISSN
- 13496336
- 09149244
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- NDL書誌ID
- 025604220
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可