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- Nozaki Koji
- Fujitsu Laboratories Ltd.
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抄録
The development of alicyclic methacrylate-based polymers has provided many opportunities for the design of new dry and immersion 193-nm resists, and their high etching resistance and transparent properties are appealing to resist chemists. The discovery of adamantanes marked a critical turning point, and the development of poly (2-methyl-2-adamantyl methacrylate-co-mevalonic lactone methacrylate)-based 193-nm resist enabled establishment of practical non-aromatic resist materials. This paper reviews our research and development.
収録刊行物
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- Journal of Photopolymer Science and Technology
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Journal of Photopolymer Science and Technology 23 (6), 795-801, 2010
フォトポリマー学会
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詳細情報 詳細情報について
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- CRID
- 1390001204326174080
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- NII論文ID
- 130004833381
- 40017411500
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- NII書誌ID
- AA11576862
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- ISSN
- 13496336
- 09149244
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- NDL書誌ID
- 10923363
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可